标准摘要
[中文适用范围]： 广泛，涉及多种半导体器件类型的特性测量，对推动相关产业的技术交流和质量控制具有基础性作用。通过规定标准化的测试环境与操作流程，该文档有效减少了测量过程中的随意性，为行业内技术数据的互换性提供了保障。作为系列标准的一部分，它特别关注测量方法的通用性原则，而非针对单一具体器件的详细测试规程，从而为后续更细分的技术标准提供了逻辑框架和方法论支持。 [外文原描述]： Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
英文名称Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods