标准摘要
[中文适用范围]： 所述测试的目的是为用于带电粒子检测和高分辨率光谱的半导体探测器建立标准测试程序。最好保持标准测试程序，以便测量人员 [外文原描述]： Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
英文名称Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures