标准摘要
[中文适用范围]: IEC 60352-3 适用于根据第 6 至第 8 章进行测试和测量的可触及绝缘位移 (ID) 连接,以及使用以下材料制作的连接:设计适当的可触及 ID 端子;具有 0.25 mm 至 3.6 mm 公称直径的实心圆形导体的导线;具有 0.05 mm² 至 10 mm² 横截面积的绞合导体的导线;用于电气和电子设备及其组件。除了测试程序外,还包含了材料和来自工业经验的数据,以提供在规定的环境条件下电气稳定的连接。不同设计和材料的可触及 ID 端子正在使用中。为此,仅规定了端子的基本参数,而导线和完整连接的性能要求则详细规定。本文件的目的是:确定可触及 ID 连接在规定的机械、电气和大气条件下的适用性;提供一种在用于制作连接的连接工具(如果有)设计或制造不同时比较测试结果的方法。 [外文原描述]: IEC 60352-3:2020 is applicable to ID connections which are accessible for tests and measurements according to Clauses 6 through 8 and which are made with – appropriately designed accessible ID terminations, – wires having solid round conductors of 0,25 mm to 3,6 mm nominal diameter, – wires having stranded conductors of 0,05 mm2 to 10 mm2 cross-sectional area, for use in electrical and electronic equipment and components. Information on materials and data from industrial experience is included in addition to the test procedures to provide electrically stable connections under prescribed environmen-tal conditions. There are different designs and materials for accessible ID terminations in use. For this reason only fundamental parameters of the termination are specified, while the perfor-mance requirements of the wire and the complete connection are specified in full detail. The purpose of this document is: – to determine the suitability of accessible ID connections under specified mechanical, electrical and atmospheric conditions; – to provide a means of comparing test results when the tools used to make the con-nections, if any, are of different designs or manufacture. This second edition cancels and replaces the first edition published in 1993. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the pre-vious edition: a) Subclause 7.2.2: reduce the limit of duration of contact disturbance to 1 µs. b) Subclause 7.2.3: reduce the limit of duration of contact disturbance to 1 µs. c) Transferred Clauses 9 to 13 to Annex A (informative). d) The figures were revised for clarity.
英文名称Solderless connections - Part 3: Accessible insulation displacement (ID) connections - General requirements, test methods and practical guidance