标准摘要
[中文适用范围]： 1 范围 本部分 IEC 60444 规定了测定晶体（其品质因数 M > 4）在标称负载电容 CL 值下的负载谐振频率 fL 的标准方法，以及测定其在标称频率下有效负载电容 CLeff 的方法。 [外文原描述]： IEC 60444-11:2026 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4. This edition includes the following significant technical changes with respect to the previous edition: a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A; b) some formulae in the first edition have been corrected.
英文名称Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction