标准摘要
[中文适用范围]： “IEC 60444的本部分适用于石英晶体单元的驱动电平依赖性（DLD）的测量。描述了两种测试方法（A和C）和一种参考方法（B）。“方法A”@基于符合 IEC 60444-1@ 的网络可用于 IEC 60444 本部分涵盖的完整频率范围。“参考方法 B”@ 基于符合 IEC 60444-1@ 的网络或反射方法IEC 60444-5 或 IEC 60444-8 可用于 IEC 60444 本部分所涵盖的完整频率范围。“方法 C”@ 振荡器方法 @ 适用于使用固定频率测量大量基模晶体单元。状况。” [外文原描述]： IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition: a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B. b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
英文名称Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)