石英晶体元件参数的测量.第6部分:驱动电平相关性（DLD）的测量

[中文适用范围]： 本文件适用于石英晶体元件的驱动电平静度依赖性（DLD）测量。描述了两种测试方法（A和C）和一种参考方法（B）。"方法A"基于IEC 60444-5中描述的π网络，可用于本文件覆盖的整个频率范围。"参考方法B"基于IEC 60444-5或IEC 60444-8中描述的π网络或反射法，可用于本文件覆盖的整个频率范围。"方法C"是一种振荡器方法，适用于在固定条件下对基模石英晶体元件进行大批量测量。注：本文档中规定的测量方法不仅适用于AT切型，还适用于其他晶体切型和振动模式，例如双旋转切型（IT、SC）和音叉晶体元件（通过使用高阻抗测试夹具）。 [外文原描述]： IEC 60444-6:2021 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based on the p-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the p-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture). This edition includes the following significant technical changes with respect to the previous edition: - some equations have been removed and corrected; - it has been specified in the note of the Scope that the measurement methods specified in this document are not only applicable to AT-cut but also to other crystal cuts and vibration modes.