石英晶体元件参数的测量.第8部分:表面贴装石英晶体元件用测量夹具

[中文适用范围]： IEC 60444 的这一部分描述了适用于 IEC 61837（所有部分）中定义的外壳中无引线表面安装石英晶体单元的测试夹具。这些夹具允许使用 IEC 60444-5 中指定的测量技术来测量（串联）谐振频率、（串联）谐振电阻以及等效电路参数 L1、C1 和 C0，并确定负载谐振频率和负载谐振电阻根据 IEC TR 60444-4 和 IEC 60444-11。本文档描述了两种测试夹具： 1) 使用网络电路的夹具，其电气值如 IEC 60444-1 中所述，用于在高达 500 MHz 的传输模式下进行测量。该夹具包括添加物理负载电容器的可选方法，用于根据 IEC 60444-4 测量高达 30 MHz 的负载谐振参数。负载电容范围为10pF以上。下面解释测量系统和 CL 适配器板的校准。 2) 基于反射法的夹具，适用于高达1200 MHz的频率范围。预计不会有增加物理负载电容的措施。负载谐振参数可以使用IEC 60444-11的方法来测量。 [外文原描述]： IEC 60444-8:2016 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11. Two test fixtures are described in this document: 1) A fixture using the p-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter. 2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11. This edition includes the following significant technical changes with respect to the previous edition: a) modification of Clause 1; b) modification of 5.2; c) modification of 5.3; d) modification of 5.4; e) 6.3 Calibration of the reflection measurement system.