电气和电子设备用连接器.试验和测量.第23-3部分:屏蔽和过滤试验.试验23c:连接器和附件的屏蔽效能.线注入法

[中文适用范围]： IEC 60512 的这一部分定义了一种标准测试方法，用于测量屏蔽连接器@或未配备集成屏蔽的连接器在安装屏蔽附件并端接屏蔽电缆后的屏蔽效能SE。完整的组件在其整个长度上具有连续的 360° 防护能力。注 1：实际上，根据连接器的几何形状，并不总是能够实现连续 360° 屏蔽。注2 屏蔽??在本文档中，“筛选”的含义与“筛选”相同。该测试方法可适用于屏蔽连接器和具有屏蔽能力的连接器配件。可以测试以下不同的连接器设计： ?C 圆形连接器； ?C 矩形连接器； ?印制板用C连接器； ?C连接器屏蔽配件。注3：对于“附件”的定义参见 IEV 581-24-10。屏蔽附件（即为非固有屏蔽连接器提供屏蔽的附件）可以是一组合适的屏蔽外壳，在电缆出口处的（屏蔽）电缆的屏蔽层之间提供沿配合连接器组@的电气连续性。自由电缆连接器外壳和固定连接器外壳的金属安装表面。自由连接器外壳配有电缆屏蔽夹。该测试方法利用的原理是，连接器/附件/电缆组件的固有屏蔽特性是其表面传输阻抗ZT，ZT可以表示为屏蔽内部相对于外壳上电流的纵向电压。该测试方法基于两个阻抗匹配电路。测量原理见图1。被测连接器样本集成到次级电路02中。激活电磁场@的初级电路01@的阻抗匹配注入线平行于被测样本的表面。该测试还适用于测量数据总线系统中使用的配有三轴触点的连接器的屏蔽效能，该三轴触点以屏蔽@双绞线电缆@端接。注 4：本标准已被 ASD-STAN（以前称为 AECMA）采纳为 EN 2591-212。 [外文原描述]： IEC 60512-23-3:2018. defines a standard test method for measuring the shielding effectiveness SE of a shielded connector, or of a connector not provided with integral shield once fitted with a shielding accessory and terminated with a screened cable. The complete assembly has a continuous 360° shielding capability throughout its length. This test method can be applied to shielded connectors and to connector accessories with shielding capability. The following different connector designs can be tested: - circular connectors; - rectangular connectors; - connectors for printed boards; - connector shielding accessories. This test method utilizes the principle that the intrinsic shielding property of the connector/ accessory/cable assembly is its surface transfer impedance ZT which can be expressed as the longitudinal voltage inside the shield, relative to the current flow on the outside shell. This test is also suitable for measuring the shielding effectiveness of a connector fitted with triaxial contacts terminated with shielded, twisted pair cables, as used in data bus systems. This second edition cancels and replaces the first edition, published in 2000. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) an introduction has been added to provide some guidance to this document in view of concurrent test method 23g in the same family; b) the frequency range for which this test method is considered reliable moved from 1 GHz to 3 GHz, to be consistent with Figure 7 (unchanged) and current industry practice and need; c) update to IEC 62153-4-6:2017 of former normative reference IEC 60096-4-1:1990, withdrawn and incorrect (should have been IEC 61196-1:1995, also withdrawn); d) update to current subclause numbers of IEC 62153-4-6:2017 what were the previous subclause numbers referenced in IEC 61196-1:1995 (wrongly attributed to IEC 60096-4-1:1990). For immediate understanding the title of these subclauses has been added; e) alignment of title to the current scope of SC 48B (connectors) and inclusion of electrical equipment as target application of said connectors (per current scope of TC 48) and explicit reference to the method – line injection – for the measurement of transfer impedance; f) symbols SE for shielding effectiveness and ZT for surface transfer impedance added throughout the document; g) list of connectors to which the test method is applicable – previously in 3.1 – moved in scope; h) former name of AECMA organization changed to the current ASD-STAN; i) “specimen” used instead of “sample” throughout the document; j) clarification in the title of what transfer impedance is described in Table 3 and editorial improvement of the same; k) “dielectric constant” changed into the updated term “relative permittivity”; l) added a note to warn about the fact that this test method requires in 6.6 a TDR with more stringent rise time of less than 100 ps than the value of less than 350 ps specified both in IEC 62153-4-6 and in EN 50289-1-6 for the similar line injection method applied to screened cables, whereas test 23g of IEC 60512-23-7 specifies for the same purpose a TDR with a rise time of less than 200 ps; m) adoption of term “connector housing” [IEV 581-27-10] instead of “shell” to address the connector accessory providing the shielding; n) title “Transfer impedance ZT [Ω]” added to the ordinate axis on the left side of double log diagram of Figure 7; o) explanatory note to clarify the conversion formula for SE from ZT added. Key words: Connectors, Screening and Filtering Tests, Shielding Effectiveness