电气和电子设备用连接器.试验和测量.第28-100部分:2000兆赫以下的信号完整性试验.试验28a至28g

[中文适用范围]： IEC 60512-28-100 规定了适用于 IEC 60603-7、IEC 61076-1、IEC 61076-2 和 IEC 61076-3 标准中规定的连接硬件应用部件的信号完整性和传输性能测试方法，频率范围高达 2 000 MHz。它也适用于测试较低频率的连接件，但所规定的测试方法对于任何给定连接件的详细规范中指定的测试方法仍是该连接件的参考符合性测试。上述连接器系列标准列表不排除在其他连接器制造商的规格书或已发布的标准中引用本文件。本文提供的测试程序包括：插入损耗（测试 28a）、回波损耗（测试 28b）、近端串扰（NEXT，测试 28c）、远端串扰（FEXT，测试 28d）、横模转换损耗（TCL，测试 28f）和横模转换传输损耗（TCTL，测试 28g）。 [外文原描述]： IEC 60512-28-100:2019 specifies the test methods for signal integrity and transmission performance for connectors specified in respective parts of IEC 60603-7, IEC 61076-1, IEC 61076-2, and IEC 61076-3 standards for connecting hardware applications up to 2 000 MHz. It is also suitable for testing lower frequency connectors, however, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector. The above list of connector series of standards does not preclude referencing this document in other connector manufacturer’s specifications or published standards. Test procedures provided herein are: - insertion loss, test 28a; - return loss, test 28b; - near-end crosstalk (NEXT) test 28c; - far-end crosstalk (FEXT), test 28d; - transverse conversion loss (TCL), test 28f; - transverse conversion transfer loss (TCTL), test 28g. Other test procedures referenced herein are: - transfer impedance (ZT), see IEC 60512-26-100, test 26e. - for coupling attenuation (aC), see IEC 62153 4 12. This second edition cancels and replaces the first edition, issued in 2013, and constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - The title is revised from 1 000 MHz to 2 000 MHz to reflect the range of frequencies which may be tested. - All tables and requirements have been revised up to 2 000 MHz. Key words: Connectors, Signal Integrity Tests