标准摘要
[中文适用范围]： 定义了 IECQ 体系中使用的质量评估的一般程序，并给出了以下一般规则： - 电气特性的测量方法； - 气候和机械测试； - 耐力测试。 [外文原描述]： It is a generic specification for semiconductor devices, discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for measuring methods of electrical characteristics, climatic and mechanical tests, and endurance tests.
英文名称Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits