标准摘要
[中文适用范围]： 适用于分立半导体器件的质量评估。给出了质量一致性检验（包含在IECQ体系的QC 750000中）和端子标识的具体要求；代表截面规格。康泰 [外文原描述]： Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.
英文名称Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices