标准摘要
[中文适用范围]： IEC 60747-2:2025 规定了以下离散半导体器件的专用产品标准，包括术语、字母符号、基本额定值和特性（性能）、测量和测试方法、型式试验、例行试验、耐久性试验以及标识的要求：- 通用整流二极管；- 雪崩整流二极管；- 快速开关整流二极管；- 肖特基势垒二极管。如果不会引起歧义，上述任何一种均可称为二极管。与前一版相比，本版包含以下重大技术变更：a) 增加了部分热阻（结到壳）的术语和定义；b) 对第3、4、5、6和7章进行了修订，删除了不再使用的部分信息，并补充了一些必要的内容。 [外文原描述]： IEC 60747-2:2025 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics (properties), measuring and test methods, requirements for type tests, routine tests, endurance tests and marking for the following discrete semiconductor devices: - generic rectifier diodes; - avalanche rectifier diodes; - fast-switching rectifier diodes; - Schottky barrier diodes. If no ambiguity is likely to result, any of the above will be referred to as diodes. This edition includes the following significant technical changes with respect to the previous edition: a) the terms and definitions for partial thermal resistance junction-to-case have been added; b) Clauses 3, 4, 5, 6 and 7 have been amended with some deletions of information no longer in use and with some necessary additions.
英文名称Semiconductor devices - Part 2: Discrete devices - Rectifier diodes