标准摘要
[中文适用范围]： 本部分IEC 60747-5规定了基于热反射（TR）方法测量单个LED芯片或封装表面温度的方法。TR效应是指光的反射率随物质温度变化的现象。本部分通过测量沉积在冶金pn结附近金属膜的光反射率相对变化来反映LED结温的相对变化。当金属表面与pn结之间的热阻效应可以忽略不计时，表面温度可近似为结温。 [外文原描述]： IEC 60747-5-14:2022(E) specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.
英文名称Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method