标准摘要
[中文适用范围]： IEC 60747 的这一部分描述了适用于不打算用于光纤系统或子系统的光电器件的测量方法。 [外文原描述]： Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
英文名称Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods