标准摘要
[中文适用范围]： 测试的目的是检查内部材料、结构和工艺是否符合适用规范的要求。这些测试通常在封盖或封装之前进行，在 100% 检查的基础上进行 [外文原描述]： The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
英文名称Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits