标准摘要
[中文适用范围]： IEC 60749 的这一部分适用于半导体器件（分立器件和集成电路），并制定了该系列所有其他部分通用的规定。当本标准与相关采购规范相矛盾时，以相关采购规范为准。 [外文原描述]： Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 1: General