标准摘要
[中文适用范围]： 本标准是半导体器件机械和气候试验方法第11部分：温度快速变化；二液浴法；勘误2. [外文原描述]： Modification of the validity date: now put at 2007.
英文名称Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method