标准摘要
[中文适用范围]： IEC 60749 的这一部分描述了确定半导体器件耐腐蚀性的盐气氛测试。这是一项加速测试，模拟恶劣的海岸大气对所有暴露表面的影响。它仅适用于指定用于海洋环境的设备。盐气氛试验被认为是破坏性的。一般来说，该盐气氛试验符合 IEC 60068-2-11，但由于半导体的特殊要求，适用本标准的条款。 [外文原描述]： Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere