标准摘要
[中文适用范围]： IEC 60749 的这一部分描述了确定半导体器件耐腐蚀性的盐气氛测试。这是一项加速测试，模拟恶劣的海岸大气对所有暴露表面的影响。它仅适用于指定用于海洋环境的设备。盐气氛测试被认为是破坏性的。 [外文原描述]： IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere