标准摘要
[中文适用范围]： 用于确定半导体器件在中子环境中退化的敏感性。适用于集成电路和分立半导体器件。 [外文原描述]： Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation