标准摘要
[中文适用范围]： 列出了适用于半导体器件（分立器件和集成电路）的测试方法，可以从中进行选择。建立统一的优选测试方法和应力水平的优选值，以判断半导体器件的环境特性。 [外文原描述]： Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
英文名称Semiconductor devices - Mechanical and climatic test methods