标准摘要
[中文适用范围]： IEC 60749-24:2025 规定了无偏压的高加速应力测试（HAST）。HAST 的目的是评估非密封封装的固态器件在潮湿环境中的可靠性。该测试是在非冷凝条件下，通过温度和湿度的高加速作用，加速水分穿透外部保护材料（封装材料或密封层）或沿外部保护材料与穿过其中的金属导体之间的界面渗透的过程。在本测试中不施加偏压，以确保因偏压可能被掩盖的失效机制能够被揭示（例如电化学腐蚀）。该测试用于识别封装内部的失效机制，并具有破坏性。本版与前一版相比，进行了以下重大技术修改：a）重新排列条款，以重新定位要求；b）在测试后电气程序中增加了两项说明。 [外文原描述]： IEC 60749-24:2025 specifies unbiased highly accelerated stress testing (HAST). HAST is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. Bias is not applied in this test to ensure that the failure mechanisms potentially overshadowed by bias can be uncovered (e.g. galvanic corrosion). This test is used to identify failure mechanisms internal to the package and is destructive. This edition includes the following significant technical changes with respect to the previous edition: a) rearrangement of clauses to reposition requirements; b) addition of two notes to the post-test electrical procedures.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST