标准摘要
[中文适用范围]： 根据半导体器件因暴露于定义的人体模型静电放电而损坏或退化的敏感性，建立了测试和分类半导体器件的标准程序。目标是提供可靠、可重复的 [外文原描述]： Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)