半导体器件 机械和气候试验方法 第26部分：静电放电（ESD）敏感度测试 人体模型（HBM）

[中文适用范围]： IEC 60749-26:2025 CMV 包含标准正文及其注释版本。注释版本为用户提供了便捷的方式，用于比较 IEC 60749-26:2025（第5版）与 IEC 60749-26:2018（第4版）之间的所有变更内容。此外，IEC TC 47 专家还提供了相关注释，用于解释最为重要的变更原因或澄清内容的任何部分。 IEC 60749-26:2025 规定了测试、评估和分类组件及微电路的程序，这些程序依据其对暴露于规定的人体模型（HBM）静电放电（ESD）造成损坏或退化的敏感性。本文件的目的是建立一种测试方法，以模拟 HBM 故障，并在不同测试设备间提供可重复且可靠的 HBM ESD 测试结果，无论组件类型如何。可重复的数据将允许对 HBM ESD 敏感度水平进行准确的分类和比较。 半导体器件的 ESD 测试方法可从本测试方法、机器模型（MM）测试方法（参见 IEC 60749-27）或其他 IEC 60749 系列中的 ESD 测试方法中选择。除非另有说明，本测试方法为首选方案。 与前一版相比，本版包含以下重大技术变更： a) 添加了新的定义； b) 增加了有关“低寄生效应”标识及其相应允许范围的说明。新标识包括了可通过测试程序的器件最大引脚数。 [外文原描述]： IEC 60749-26:2025 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC 60749-26:2025 edition 5.0 and the previous IEC 60749-26:2018 edition 4.0. Furthermore, comments from IEC TC 47 experts are provided to explain the reasons of the most relevant changes, or to clarify any part of the content.to clarify any part of the content. IEC 60749-26:2025 establishes the procedure for testing, evaluating, and classifying components and microcircuits in accordance with their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749‑27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected. This edition includes the following significant technical changes with respect to the previous edition: a) new definitions have been added; b) text has been added to clarify the designation of and allowances resulting from “low parasitics”. The new designation includes the maximum number of pins of a device that can pass the test procedure.