半导体器件 - 机械和气候试验方法 - 第26部分:静电放电（ESD）灵敏度测试 - 人体模型（HBM）

[中文适用范围]： 本部分 IEC 60749 规定了根据元器件和微电路对规定的人体模型 (HBM) 静电放电 (ESD) 暴露的易感性（灵敏度）进行测试、评估和分类的程序。本文件的目的是建立一个能够复现 HBM 失效的测试方法，并提供可靠、可重复的 HBM ESD 测试结果，无论元器件类型如何。可重复的数据将允许对 HBM ESD 灵敏度等级进行准确的分类和比较。半导体器件的 ESD 测试从本测试方法、机器模型 (MM) 测试方法（参见 IEC 60749-27）或 IEC 60749 系列中的其他 ESD 测试方法中选择。除非另有规定，本测试方法是选定的方法。 [外文原描述]： IEC 60749-26:2025 establishes the procedure for testing, evaluating, and classifying components and microcircuits in accordance with their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749‑27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected. This edition includes the following significant technical changes with respect to the previous edition: a) new definitions have been added; b) text has been added to clarify the designation of and allowances resulting from “low parasitics”. The new designation includes the maximum number of pins of a device that can pass the test procedure.