标准摘要
[中文适用范围]： 涵盖集成电路的 I 测试和过压闩锁测试。该测试的目的是建立一种确定集成电路闩锁特性的方法并定义闩锁故障标准。闩锁特性 [外文原描述]： Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test