标准摘要
[中文适用范围]： “范围和对象 IEC 60749 的这一部分涵盖了集成电路的 I 测试和过压闩锁测试。该测试被归类为破坏性测试。该测试的目的是建立一种确定集成电路 (IC) 闩锁的方法特性并定义闩锁故障标准。闩锁特性用于确定产品可靠性并最大限度地减少由闩锁引起的“未发现故障”(NTF) 和“电气过应力”(EOS) 故障。测试方法主要适用于 CMOS 器件。必须建立对其他技术的适用性。作为温度函数的闩锁分类在 3.1 中定义，故障级别标准在 3.2 中定义 [外文原描述]： IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include: - a number of minor technical changes; - the addition of two new annexes covering the testing of special pins and temperature calculations.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test