标准摘要
[中文适用范围]： IEC 60749的这一部分提供了高度加速的温度和湿度应力测试（HAST），用于评估非气密封装半导体器件在潮湿环境中的可靠性。 [外文原描述]： Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. The contents of the corrigendum of August 2003 have been included in this copy.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)