标准摘要
[中文适用范围]： 本部分IEC 60749规定了基于鉴定规范执行有效耐久性、保持力和跨温度测试的程序要求。耐久性和保持力鉴定规范（包括循环次数、持续时间、温度和样本量）规定在JESD47中，或基于知识方法（如JESD94）开发。 [外文原描述]： IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices