标准摘要
[中文适用范围]： 提供稳态温度和湿度偏置寿命测试，用于评估非气密封装固态器件在潮湿环境中的可靠性。 [外文原描述]： Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test