标准摘要
[中文适用范围]： IEC 60749的这一部分提供了稳态温度和湿度偏置寿命测试，用于评估非气密封装固态器件在潮湿环境中的可靠性。该测试方法被认为是破坏性的。 [外文原描述]： IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) correction of an error in an equation; b) inclusion of notes for guidance; c) clarification of the applicability of test conditions.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test