标准摘要
[中文适用范围]： IEC 60749 这部分的目的是测试和测量金属或陶瓷密封设备内部大气中的水蒸气和其他气体含量。它适用于以这种方式密封的半导体器件，但通常仅用于高可靠性应用，例如军事或航空航天。它可以是破坏性的（方法 1 和 2）或非破坏性的（方法 3）。 [外文原描述]： Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. The contents of the corrigendum of August 2003 have been included in this copy.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases