标准摘要
[中文适用范围]： 本国际标准规定了金属或陶瓷密封装置内大气中水蒸气和其他气体含量的测试和测量。该测试用于衡量密封过程的质量，并提供有关包装内空气的长期化学稳定性的信息。它适用于以这种方式密封的半导体器件，但通常仅用于高可靠性应用，例如军事或航空航天。这个测试是破坏性的。 [外文原描述]： IEC 60749-7:2011 specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive. This second edition cancels and replaces the first edition published in 2002 and constitutes a technical revision. This second edition has been completely re-written so as to align it with the text of the latest versions of MIL-STD-750, method 1018 and MIL-STD-883, method 1018. The main change is the removal of the two alternative methods formerly designated method 2 and method 3.
英文名称Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases