标准摘要
[中文适用范围]： 包括确定温度系数、内部串联电阻和曲线校正因子的程序。该程序适用于测量水平的 +/- 30 % 的辐照度范围。他们是李 [外文原描述]： Gives procedures that should be followed for temperature and irradiance corrections to the measured I-V characteristics of only crystalline silicon photovoltaic devices.
英文名称Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices