标准摘要
[中文适用范围]: 本文档定义了连接到低压供电网络且输入电流每相不超过 16 安培的电气和电子设备的电压跌落、短瞬断和电压变化免疫测试方法及首选测试电平范围。本文档适用于连接到 50 Hz 或 60 Hz 交流网络的电气和电子设备。本文档不适用于连接到 400 Hz 交流网络的电气和电子设备。本文档的目的是为评估电气和电子设备在遭受电压跌落、短瞬断和电压变化时的免疫能力建立通用参考。 [外文原描述]: IEC 61000-4-11:2020 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This document applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks. It does not apply to electrical and electronic equipment for connection to 400 Hz AC networks. Tests for these networks will be covered by future IEC documents. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. NOTE 1 Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this document describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. NOTE 2 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. This third edition cancels and replaces the second edition published in 2004 and Amendment 1:2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - rise time and fall time of transients are now defined terms in Clause 3; - the origin of voltage dips and short interruptions is now stated in Clause 4. The contents of the corrigendum of May 2020 and October 2022 have been included in this copy.
英文名称Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase