+AMD1:2001 CSV 电磁兼容性（EMC）.第4-17部分:试验和测量技术.直流输入电源端口的纹波抗扰度试验

[中文适用范围]： IEC 61000 的该部分定义了电气或电子设备直流输入电源端口对纹波免疫的测试方法。本标准适用于由外部整流器系统供电或由充电电池供电的低电压直流电源端口的设备。本标准的目的是建立实验室测试的通用和可重复的基础，以评估电气和电子设备在受到纹波电压（例如由整流器系统和/或辅助服务电池充电器叠加在直流电源源上产生的电压）时的性能。本标准定义了：测试电压波形；测试电平范围；测试发生器；测试装置；测试程序。此处描述的测试适用于电气或电子设备和系统。当被测设备（EUT）的额定功率大于第 6 条规定的测试发生器容量时，也适用于模块或子系统。本测试不适用于连接到包含开关模式转换器的电池充电器系统的设备。本标准未规定特定设备或系统应进行的测试。其主要目的是为 IEC 产品委员会提供通用的基本参考。这些产品委员会（或设备用户或制造商）仍负责为其设备选择合适的测试和严重程度等级。用于测试特定类别电气或电子设备的专用测试程序正在使用中，例如连接到电话交换中心直流供电网络的设备；相关的产品委员会应评估本基础标准中规定的测试程序的相关性和适用性。 This part of IEC 61000 defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. This standard is applicable to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. The object of this standard is to establish a common and reproducible basis for testing, in a laboratory, electrical and electronic equipment when subjected to ripple voltages such as those generated by rectifier systems and/or auxiliary service battery chargers overlaying on d.c. power supply sources. This standard defines test voltage waveform; range of test levels; test generator; test set-up; test procedure. The test described hereafter applies to electrical or electronic equipment and systems. It also applies to modules or subsystems whenever the equipment under test (EUT) rated power is greater than the test generator capacity specified in clause 6. This test does not apply to equipment connected to battery charger systems incorporating switch mode converters. This standard does not specify the tests to be applied to particular apparatus or systems. Its main aim is to give a general basic reference to IEC product committees. These product committees (or users or manufacturers of equipment) remain responsible for the appropriate choice of the test and the severity level to be applied to their equipment. Dedicated test procedures are in use for testing specific categories of electrical or electronic equipment, e.g. equipment connected to d.c. supply network of telephone switching centres; the related product committees should evaluate the relevance and applicability of the test procedure specified in this basic standard. [外文原描述]： Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines - test voltage waveform; - range of test levels; - test generator; - test set-up; - test procedure. This consolidated version consists of the first edition (1999) and its amendment 1 (2001). Therefore, no need to order amendment in addition to this publication.