+AMD1:2006 CSV 电磁兼容性 (EMC) 第4-20部分：测试和测量技术 横向电磁 (TEM) 波导中的发射和抗扰度测试

[中文适用范围]： IEC 61000 的这一部分涉及使用各种类型横向电磁 (TEM) 波导的电气和电子设备的发射和抗扰度测试方法。这包括开放式（例如带状线和 EMP 模拟器）和封闭式（例如 TEM 单元）结构，这些结构可进一步分为一端口、二端口或多端口 TEM 波导。频率范围取决于具体的测试要求和具体的 TEM 波导类型。该标准的目的是描述 - TEM 波导特性，包括典型频率范围和 EUT 尺寸限制； - 用于 EMC 测量的 TEM 波导验证方法； - EUT（即EUT机柜和布线）定义； - TEM 波导辐射发射测试的测试设置、程序和要求，以及 - TEM 波导辐射抗扰度测试的测试设置、程序和要求。本标准无意指定应用于任何特定设备或系统的测试。该标准的主要目的是为 IEC 所有感兴趣的产品委员会提供通用的基本参考。对于辐射发射测试，产品委员会应与 CISPR 协商选择发射限值和测试方法。对于辐射抗扰度测试，产品委员会仍然负责适当选择抗扰度测试和抗扰度测试限值以应用于其范围内的设备。该标准描述了与 IEC 61000-4-3 不同的测试方法。当产品委员会在咨询 CISPR 和 TC 77 后指定时，可以使用这些其他不同的测试方法。根据 IEC 指南 107，它具有基本 EMC 出版物的地位。该合并版本由第一版 (2003) 组成及其修正案 1 (2006)。因此，无需对本出版物进行修订。 [外文原描述]： This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe - TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; - TEM waveguide validation methods for EMC measurements; - the EUT (i.e. EUT cabinet and cabling) definition; - test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and - test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. This standard does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. These other distinct test methods may be used when so specified by product committees, in consultation with CISPR and TC 77. It has the status of a basic EMC publication in accordance with IEC Guide 107. This consolidated version consists of the first edition (2003) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.