标准摘要
[中文适用范围]: 涉及使用各种类型横向电磁 (TEM) 波导的电气和电子设备的发射和抗扰度测试方法。这包括开放式(例如,带状线和 EMP 模拟器)和封闭式(例如,TEM 室) [外文原描述]: Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe · TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test); · TEM waveguide validation methods for EMC measurements; · the EUT (i.e. EUT cabinet and cabling) definition; · test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and · test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. It has the status of a basic EMC publication in accordance with IEC Guide 107.
英文名称Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides