电磁兼容性(EMC).第4-20部分:试验和测量技术.横向电磁波导(TEM)辐射和干扰试验

[中文适用范围]： 范围和对象 IEC 61000 的本部分涉及使用各种类型横向电磁 (TEM) 波导的电气和电子设备的发射和抗扰度测试方法。这些类型包括开放结构（例如带状线和电磁脉冲模拟器）和封闭结构（例如 TEM 单元）。这些结构可以进一步分为一二或多端口 TEM 波导。频率范围取决于具体的测试要求和具体的 TEM 波导类型。该标准的目的是描述？ TEM 波导特性@，包括典型频率范围和 EUT 尺寸限制； ？ EMC 测试的 TEM 波导验证方法； ？ EUT（即EUT机柜和布线）定义； ？测试设置@程序@以及TEM波导辐射发射测试的要求和？ TEM 波导辐射抗扰度测试的测试设置@程序@和要求。注：本标准定义了测量电磁辐射对设备的影响以及相关设备的电磁发射的测试方法。电磁辐射的模拟和测量对于定量确定所有最终用途装置的影响而言不够精确。定义的测试方法的主要目标是在各种测试设施上建立足够的结果重复性，以进行效果的定性分析。本标准无意指定应用于任何特定设备或系统的测试。该标准的主要目的是为 IEC 所有感兴趣的产品委员会提供通用的基本参考。对于辐射发射测试，产品委员会应根据 CISPR 标准选择发射限值和测试方法。对于辐射抗扰度测试@产品委员会仍然负责适当选择抗扰度测试和抗扰度测试限值以应用于其范围内的设备。本标准描述的测试方法与 IEC 61000-4-3.1 1 的测试方法不同，当产品委员会@与 CISPR 和 TC 77 协商指定时，可以使用这些其他不同的测试方法。 [外文原描述]： IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe: - TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; - TEM waveguide validation methods for EMC tests; - the EUT (i.e. EUT cabinet and cabling) definition; - test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and - test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. IEC 61000-4-20:2010 does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. This second edition cancels and replaces the first edition published in 2003 and its amendment 1 (2006), and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendment are the following: - consistency of terms (e.g. test, measurement, etc.) has been improved; - clauses covering test considerations, evaluations and the test report have been added; - references to large TEM waveguides have been eliminated; - a new informative annex has been added to deal with calibration of E-field probes.