电子设备用压敏电阻第1部分：通用规范

[中文适用范围]： IEC 61051-1:2018 RLV 包含官方 IEC 国际标准及其 Redline 版本。Redline 版本仅提供英文版，可让您快速轻松地比较官方 IEC 标准与其前一版本之间的所有变化。IEC 61051-1:2018 是一种通用规范，适用于电子设备中使用的具有对称电压-电流特性的压敏电阻。它建立了标准术语、检查程序和测试方法，用于质量评估或任何其他目的的分项和详细规范。本版本与前一版本相比，包括以下重大技术变化： a) 增加了 10 个新术语和定义 - 引线压敏电阻、表面贴装压敏电阻（SMV）、静电放电（ESD）、ESD 钳位电压、等效矩形脉冲持续时间、最大峰值电流降额特性、额定平均耗散功率、额定能量、异常过压耐受持续时间和温度降额曲线（见 3.6、3.7、3.14、3.15、3.19、3.20、3.23、3.24、3.25 和 3.29）； b) 增加了电气试验的一般要求和 7 个新试验项目 — 钳位电压、ESD 钳位电压、最大峰值电流、额定平均耗散功率、额定能量、静电放电（ESD）、表面贴装压敏电阻端子的坚固性（见 6.5、6.11、6.12、6.13、6.14、6.15、6.16 和 6.17.8）； c) 在 6.6、6.7、6.8、6.9.3、6.23.2、6.23.4 和 6.26 中，修改了以下试验项目： — 压敏电压、漏电流和电容：增加了更详细的要求和信息； — 耐电压-箔法：对无轴向端子的压敏电阻器，箔边缘与每个端子之间的距离由 1 mm ～ 1.5 mm 改为 3 mm ～ 3.5 mm，对有轴向端子的压敏电阻器，箔与端子之间的最小距离由 1 mm 改为 3 mm； — 气候顺序-干热：方法由 Ba 改为 Bb； — 气候顺序-低温：方法由 Aa 改为 Ab； — 上类别温度下的耐久性：将“以 1.5 小时开、0.5 小时关的循环施加试验电压”改为在 1 000 小时的整个试验过程中连续施加试验电压的方法； d) 试验和测量程序部分删除了脉冲电流、脉冲条件下的电压和冲击的试验项目； e) 删除了附录 A 及其中规定的试验夹具的内容； f) 删除了碳化硅压敏电阻器的所有内容；g) 增加了一个新的规范性附录“本规范中使用的试验脉冲”(附录B)；h) 增加了一个新的资料性附录“供应用参考的特性和参数的推荐测量/测试方法”(附录C)，其中给出了包括电压-电流特性、最大峰值电流降额特性、热阻和异常过电压耐受持续时间等供应用参考的特性和参数的测量/测试指南。 [外文原描述]： IEC 61051-1:2018 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61051-1:2018 is a generic specification and is applicable to varistors with symmetrical voltage-current characteristics for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition: a) 10 new terms and definitions – leaded varistors, surface mount varistors(SMV), electrostatic discharge (ESD), ESD clamping voltage, equivalent rectangular pulse duration, maximum peak current derating characteristic, rated average dissipation power, rated energy, abnormal overvoltage withstanding duration and temperature derating curve – have been added (see 3.6, 3.7, 3.14, 3.15, 3.19, 3.20, 3.23, 3.24, 3.25 and 3.29); b) General requirements for electrical tests and 7 new test items – clamping voltage, ESD clamping voltage, maximum peak current, rated average dissipation power, rated energy, electrostatic discharge (ESD), robustness of terminations of surface mount varistors – have been added (see 6.5, 6.11, 6.12, 6.13, 6.14, 6.15, 6.16 and 6.17.8); c) In 6.6, 6.7, 6.8, 6.9.3, 6.23.2, 6.23.4 and 6.26, following test items have been revised: - Varistor voltage, leakage current and capacitance: more detailed requirements and information have been added; - Voltage proof – foil method: the space between the edge of the foil and each termination has been changed from 1 mm ~ 1,5 mm to 3 mm ~ 3.5 mm for testing varistors not having axial terminations and the minimum space between the foil and the termination has been changed from 1 mm to 3 mm for testing varistors having axial terminations; - Climatic sequence – dry heat: the method has been changed from Ba to Bb; - Climatic sequence – cold: the method has been changed from Aa to Ab; - Endurance at upper category temperature: the method of “applying test voltages in cycles of 1,5 h on and 0,5 h off” has been changed to the method of applying test voltages continuously throughout the test lasting for 1 000 h; d) The test items of pulse current, voltage under pulse condition and bump have been deleted from the section of test and measurement procedures; e) Annex A and the contents referring to the test fixture specified in Annex A have been deleted; f) All contents related to silicon carbide varistors have been deleted; g) A new normative annex entitled “Test pulses used in this specification” (Annex B) has been added; h) A new informative annex entitled "Recommended measurement/test methods for characteristics and parameters for application reference" (Annex C) has been added, in which guidelines of measuring/testing characteristics and parameters for application reference including voltage vs. current characteristic, maximum peak current derating characteristic, thermal resistance and abnormal overvoltage withstanding duration have been given.