标准摘要
[中文适用范围]: 给出基于可靠性改进计划中生成的故障数据的可靠性增长评估的模型和数值方法。这些程序涉及产品可靠性和良好性能的增长、估计、置信区间。 [外文原描述]: IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are: - addition of two statistical models for reliability growth planning and tracking in the product design phase; - statistical methods for the reliability growth programme in the design phase of IEC 61014; - addition of the discrete reliability growth model for the test phase; - addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models; - addition of real lif examples for most of the statistical models; - numerical correction of tables in the reliability growth test example. This publication is to be read in conjunction with IEC 61014:2003 .
英文名称Reliability growth - Statistical test and estimation methods