地面光伏组件.设计鉴定和型式认证.第1-1部分:晶体硅光伏组件试验的特殊要求

[中文适用范围]： This document lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. In climates where 98th percentile operating temperatures exceed 70°C, users are recommended to consider testing to higher temperature test conditions as described in IEC TS 63126. Users desiring qualification of PV products with lesser lifetime expectations are recommended to consider testing designed for PV in consumer electronics, as described in IEC 63163 (under development). Users wishing to gain confidence that the characteristics tested in IEC 61215 appear consistently in a manufactured product may wish to utilize IEC 62941 regarding quality systems in PV manufacturing. This document is intended to apply to all crystalline silicon terrestrial flat plate modules. This document does not apply to modules used with concentrated sunlight although it may be utilized for low concentrator modules (1 to 3 suns). For low concentration modules, all tests are performed using the irradiance, current, voltage and power levels expected at the design concentration. The objective of this test sequence is to determine the electrical characteristics of the module and to show, as far as possible within reasonable constraints of cost and time, that the module is capable of withstanding prolonged exposure outdoors. Accelerated test conditions are empirically based on those necessary to reproduce selected observed field failures and are applied equally across module types. Acceleration factors may vary with product design and thus not all degradation mechanisms may manifest. Further general information on accelerated test methods including definitions of terms may be found in IEC 62506. Some long-term degradation mechanisms can only reasonably be detected via component testing, due to long times required to produce the failure and necessity of stress conditions that are expensive to produce over large areas. Component tests that have reached a sufficient level of maturity to set pass/fail criteria with high confidence are incorporated into the IEC 61215 series via addition to Table 1 in IEC 61215-1:2021. In contrast, the tests procedures described in this series, in IEC 61215-2, are performed on modules. This document defines PV technology dependent modifications to the testing procedures and requirements per IEC 61215-1:2021 and IEC 61215-2:2021. [外文原描述]： IEC 61215-1-1:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61215-1-1:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. In climates where 98th percentile operating temperatures exceed 70 °C, users are recommended to consider testing to higher temperature test conditions as described in IEC TS 63126. This document is intended to apply to all crystalline silicon terrestrial flat plate modules. This second edition cancels and replaces the first edition of IEC 61215-1-1, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition: a. A cyclic (dynamic) mechanical load test (MQT 20) added. b. A test for detection of potential-induced degradation (MQT 21) added. c. A bending test (MQT 22) for flexible modules added. d. A procedure for stress specific stabilization – BO LID (MQT 19.3) added. e. A final stabilization procedure for modules undergoing PID testing added