标准摘要
[中文适用范围]： 微波电路通常形成在多层有机或无机基板上。在微波电路中，平面传输线（例如带状线@微带线@和共面线）的衰减由它们的导体损耗@介电损耗和辐射损耗决定。其中导体损耗是平面传输线衰减的主要因素。本文件标准化了一种新的测量方法，用于评估有机@陶瓷和LTCC（低温共烧陶瓷）基板等基板上或基板内传输线的电导率。本标准描述了导体层与介质基板之间界面电阻和有效电导率的测量方法，称为界面电阻和界面电导率。该测量方法具有以下特点： 界面电阻Ri是通过测量图2所示的TE01模式介质棒谐振器的谐振频率f0和空载品质因数Qu得到的。 ?C 界面电导率 ??相对界面电导率 ??i = ?? / ??根据测量的 Ri 值计算@ 其中 ?? = 5@8 ?? 107S/m是标准铜的电导率； ?C ??i (?????i) 的测量不确定度小于5%。 [外文原描述]： IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition: a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction; b) changes to normative references; c)addition to bibliography.
英文名称Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency