核仪器 放射探测器用高纯度锗晶体 基本特性的测量方法

[中文适用范围]： 范围和对象本标准适用于γ射线和X射线辐射探测器用高纯锗晶体。这种锗是单晶的并且具有每cm 3 少于1011个电活性杂质中心的净浓度，通常约为1010cm 3 C 3 。本国际标准规定了高纯锗晶体基本特性测量的术语和测试方法。这些特性是净电活性杂质浓度（下文中为（NA·C·ND））@深层杂质中心浓度和晶体的晶体学质量。这些测试方法不是强制性的，但已在行业中广泛使用，并向探测器制造商提供可验证的所需信息。 IEC 60973 和 IEC 60759 中给出了组装完成的锗探测器的测试方法。 [外文原描述]： IEC 61435:2013(E) is applicable to high-purity germanium crystals used for radiation detectors for gamma-rays and X-rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3. This International Standard specifies terminology and test methods for measurements of basic characteristics of high-purity germanium crystals. Test methods for completed assembled germanium detectors are given in IEC 60973 and IEC 60759. The main technical changes with regard to the previous edition are as follows: - review the existing requirements; - update the terminology and definitions.