电缆配件、电缆、连接器和无源微波元件.利用混响室法测量滤屏衰减

[中文适用范围]： 现代电子设备的要求表明需要一种在整个频率范围内测试微波元件屏蔽衰减的方法。对于低频和规则形状的部件存在方便的测试方法。这些测试方法在相关的 IEC 产品规范（例如 IEC 62153-4-3）中进行了描述。对于更高的频率和不规则形状的部件，需要一种新的测试方法，并且本国际标准中描述了这种测试方法。本国际标准描述了通过混响室测试方法（有时称为模式搅拌室）测量屏蔽衰减，该方法几乎适用于任何类型的微波组件，并且没有理论频率上限。由于测试设备的尺寸，它仅局限于低频，而测试设备的尺寸与频率相关，并且只是测量屏蔽衰减的几种方法之一。就本标准而言，微波组件的示例包括波导、移相器、双工器/多路复用器、功率分配器/组合器等。 [外文原描述]： IEC 61726:2015 describes the measurement of screening attenuation by the reverberation chamber test method, sometimes named mode stirred chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency-dependent and is only one of several methods of measuring screening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners etc. This third edition cancels and replaces the second edition, published in 1999. This edition constitutes a technical revision. It takes into account the latest developments in the design of reverberation chambers as described in IEC 61000-4-21, which is also referencing this standard as a possible test method. Furthermore, an alternative measurement procedure is added which is able to reduce the measurement time needed.