电缆组件 电缆 连接器和无源微波元件.用混响室法测量屏蔽衰减

[中文适用范围]： 本文档描述了通过混响室测量方法（也称为模式搅拌室方法）测量屏蔽衰减。本文档适用于电缆组件、电缆、连接器以及无源微波组件（如波导、移相器、双工器/多工器、功率分配器/组合器等）的屏蔽衰减测量。现代电子设备已显示出在整个频率范围内测试微波组件屏蔽衰减性能的需求。对于较低频率和规则形状的组件，存在方便的测量方法。这些测量方法在IEC 62153系列中进行了描述。对于更高频率和不规则形状的组件，可以使用混响室方法。理论上，混响室测量方法没有测量频率的上限，但受测量系统质量和灵敏度的限制，且测量频率的下限受混响室尺寸的限制。 [外文原描述]： IEC 61726:2022 describes the measurement of screening attenuation by the reverberation chamber measurement method, also called mode stirred chamber method. This document is applicable to screening attenuation measurements of cable assemblies, cables, connectors, and passive microwave components, such as waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc. This fourth edition cancels and replaces the third edition published in 2015. This edition includes the following significant technical changes with respect to the previous edition: a. reworded Clause 1 "Scope"; b. replaced IEC TS 62153-4-1 by IEC 62153 (all parts) in Clause 2; c. added the definition of screening attenuation in 3.1; d. added Clause 4 "Principle of screening attenuation measurement"; e. added the descriptions of some test set-ups, such as frequency synthesizer, spectrum analyser, stepper motor, linking devices and the sampling system, etc. in Clause 5; f. added Clause 6 "DUT"; g. reworded Clause 7 "Measurement procedure"; h. added Clause 8 "Caution notes"; i. added Clause 9 "Acceptance criterion"; j. added Clause 10 "Information to be given in the relevant specification".