标准摘要
[中文适用范围]: IEC 61788-15:2026 标准红线条款版本(RLV)同时包含正式的 IEC 国际标准文本及其带修订痕迹的对照版本。其中,红线条款版本仅提供英文,便于用户快速、便捷地对照正式 IEC 标准与其上一版本之间的全部修订内容。 IEC 61788-15:2026 规定了一种经过改进的双谐振模式介质谐振器方法,用于测量高温超导(HTS)薄膜在微波频段下的本征表面阻抗(Zs)。测量旨在获取谐振频率 f0 处本征表面阻抗 Zs 随温度的变化关系。该方法适用于 HTS 薄膜的频率、厚度范围及测量分辨率如下: - 频率范围:最高至 40 GHz; - 薄膜厚度:大于 50 nm; - 测量分辨率:在 10 GHz 时为 0.01 mΩ。 为确保数据可比性,必须报告测量频率下的 Zs 数据,并按 f² 规则(适用于本征表面电阻 Rs,f < 40 GHz)和 f¹ 规则(适用于本征表面电抗 Xs)将其归一化至 10 GHz 进行比较。 本第二版于 2026 年发布,废止并取代 2011 年出版的第一版,属于技术修订版。与前一版本相比,主要技术变更包括: - 新增信息性附录 B,内容为本征表面阻抗的联合相对标准不确定度评估; - 将原文中“精密度与准确度”术语统一替换为“不确定度”; - 新增轮询测试(round robin test)所得结果。 [外文原描述]: IEC 61788-15:2026 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61788-15:2026 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0. The frequency and thickness range and the measurement resolution for the Zs of HTS films are as follows: - frequency: up to 40 GHz; - film thickness: greater than 50 nm; - measurement resolution: 0,01 mΩ at 10 GHz. It is crucial that the Zs data at the measured frequency, and that scaled to 10 GHz be reported for comparison, assuming the f2 rule for the intrinsic surface resistance, Rs (f < 40 GHz), and the f rule for the intrinsic surface reactance, Xs. This second edition cancels and replaces the first edition published in 2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - informative Annex B, combined relative standard uncertainty in the intrinsic surface impedance is added; - the terms, ‘precision and accuracy’, are replaced with uncertainty; - results from a round robin test are added.
英文名称Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies