超导性 第15部分：电子特性测量 微波频率下超导薄膜的固有表面阻抗

[中文适用范围]： IEC 61788-15:2026 描述了采用改进的双谐振模式介质谐振器法，在微波频段下测量高温超导体（HTS）薄膜本征表面阻抗（Zs）的方法。测量旨在获取在谐振频率 f0 下，本征 Zs 随温度变化的特性。HTS 薄膜 Zs 的测量频率范围、薄膜厚度范围及测量分辨率如下： - 频率：最高至 40 GHz； - 薄膜厚度：大于 50 nm； - 测量分辨率：在 10 GHz 时为 0.01 mΩ。 为确保数据可比性，必须报告在实测频率下的 Zs 数据，并将其归一化至 10 GHz。该归一化基于以下假设：本征表面电阻 Rs（当 f < 40 GHz 时）遵循 f² 规律，本征表面电抗 Xs 遵循 f 规律。 本版为第二版，取消并取代于 2011 年发布的第一版，属于技术修订版。相较于前一版本，本版包含以下重要技术变更： - 新增资料性附录 B，用于阐述本征表面阻抗的合成相对标准不确定度； - 将“精密度与准确度”术语统一替换为“不确定度”； - 新增一项多实验室间比对试验（环测试）的结果。 [外文原描述]： IEC 61788-15:2026 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0. The frequency and thickness range and the measurement resolution for the Zs of HTS films are as follows: - frequency: up to 40 GHz; - film thickness: greater than 50 nm; - measurement resolution: 0,01 mΩ at 10 GHz. It is crucial that the Zs data at the measured frequency, and that scaled to 10 GHz be reported for comparison, assuming the f2 rule for the intrinsic surface resistance, Rs (f < 40 GHz), and the f rule for the intrinsic surface reactance, Xs. This second edition cancels and replaces the first edition published in 2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - informative Annex B, combined relative standard uncertainty in the intrinsic surface impedance is added; - the terms, ‘precision and accuracy’, are replaced with uncertainty; - results from a round robin test are added.