超导性 第17部分 电气特性测量值 大面积超导薄膜的局部临界电流密度及其分布

[中文适用范围]： IEC 61788 的这一部分描述了使用三次谐波电压通过感应方法测量大面积高温超导 (HTS) 薄膜中的局部临界电流密度 (Jc) 及其分布。精确测量最重要的考虑因素是通过电场准则确定液氮温度下的 Jc，并根据其频率依赖性获得电流-电压特性。虽然可以在施加的直流磁场中测量 Jc [20@ 21]2@，但本标准的范围仅限于没有直流磁场的测量。该技术本质上测量临界片电流，即 Jc 和膜厚度 d 的乘积。 HTS 薄膜的 Jcd 范围和测量分辨率如下： ?C Jcd ：从 200 A/m 到 32 kA/m（基于结果@但不限于）； ?C 测量分辨率：100 A/m（基于结果@但不限于）。 [外文原描述]： IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.