超导性第17部分:电子特性测量大面积超导薄膜中的局部临界电流密度及其分布

[中文适用范围]： 本IEC 61788第17部分规定了通过利用三次谐波电压的感应方法，测量大面积高温超导（HTS）薄膜的局部临界电流密度（Jc）及其分布。精确测量的最重要考虑因素是通过电场标准确定液氮温度下的Jc，并根据其频率依赖性获得电流-电压特性。尽管可以在施加的直流磁场下测量Jc，但本文档的范围仅限于无直流磁场时的测量。该技术在本质上测量的是临界面电流，即Jc与薄膜厚度d的乘积。HTS薄膜的Jc d范围和测量分辨率如下：Jc d：从200 A/m到32 kA/m（基于结果，非限制）；测量分辨率：100 A/m（基于结果，非限制）。 [外文原描述]： IEC 61788-17:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows. - Jcd: from 200 A/m to 32 kA/m (based on results, not limitation). - Measurement resolution: 100 A/m (based on results, not limitation).